Statistical analysis of reliability and life-testing models : theory and methods /

Bibliographic Details
Main Author: Bain, Lee J., 1939-
Format: Book
Language:English
Published: New York : M. Dekker, [1978]
Series:Statistics, textbooks and monographs ; v. 24.
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TS173 .B34
 
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TS173 .B34 Available