Adhesion measurement of thin films, thick films, and bulk coatings : a symposium presented at ASTM headquarters, American Society for Testing and Materials, Philadelphia, Pa., 2-4 Nov. 1976 /

Bibliographic Details
Corporate Authors: Symposium on Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings Philadelphia, Pa., American Society for Testing and Materials
Other Authors: Mittal, K. L., 1945-
Format: Conference Proceeding Book
Language:English
Published: Philadelphia : The Society, [1978]
Series:ASTM special technical publication ; 640.
Subjects:

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Call Number: QC183 .S95 1976
 
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QC183 .S95 1976 Available