Physical aspects of electron microscopy and microbeam analysis /
| Main Author: | Siegel, Benjamin M. |
|---|---|
| Corporate Authors: | Electron Microscopy Society of America, Microbeam Analysis Society |
| Other Authors: | Beaman, Donald Robert |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Wiley,
[1975]
|
| Series: | Wiley biomedical-health publication.
|
| Subjects: |
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