Physical aspects of electron microscopy and microbeam analysis /

Bibliographic Details

Main Author:	Siegel, Benjamin M.
Corporate Authors:	Electron Microscopy Society of America, Microbeam Analysis Society
Other Authors:	Beaman, Donald Robert
Format:	Book
Language:	English
Published:	New York : Wiley, [1975]
Series:	Wiley biomedical-health publication.
Subjects:	Electron microscopes. Microprobe analysis. Microchemistry. Electron Probe Microanalysis. Microscopy, Electron.