Cover Image

Physical aspects of electron microscopy and microbeam analysis /

Bibliographic Details
Main Author: Siegel, Benjamin M.
Corporate Authors: Electron Microscopy Society of America, Microbeam Analysis Society
Other Authors: Beaman, Donald Robert
Format: Book
Language:English
Published: New York : Wiley, [1975]
Series:Wiley biomedical-health publication.
Subjects:
Electron microscopes.
Microprobe analysis.
Microchemistry.
Electron Probe Microanalysis.
Microscopy, Electron.
Description
Item Description:Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
"A Wiley biomedical-health publication."
Physical Description:xiii, 474 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0471790206