Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. Wiley.
Chicago Style (17th ed.) CitationSiegel, Benjamin M., and Donald Robert Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. New York: Wiley, 1975.
MLA (9th ed.) CitationSiegel, Benjamin M., and Donald Robert Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. Wiley, 1975.
Warning: These citations may not always be 100% accurate.