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Ion beam surface layer analysis /

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Bibliographic Details
Corporate Author: International Conference on Ion Beam Surface Layer Analysis Karlsruhe
Other Authors: Meyer, Otto, Linker, Gerhard, Käppeler, F. (Franz)
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1976]
Subjects:
Thin films > Effect of radiation on > Congresses.
Ion bombardment > Congresses.
Straggling (Nuclear physics) > Congresses.
Backscattering > Congresses.
Surfaces (Technology) > Congresses.

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Call Number: QC176.84.R3 I57 1975
Library Owns: QC176.84.R3 I57 1975 (v.1-v.2)
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QC176.84.R3 I57 1975 v.1 Available
QC176.84.R3 I57 1975 v.2 Available