The measurement of intelligence ; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale /

Bibliographic Details

Main Author:	Terman, Lewis M. (Lewis Madison), 1877-1956
Format:	Book
Language:	English
Published:	Boston, New York, [etc.] : Houghton Mifflin company, [1916]
Series:	Riverside textbooks in education.
Subjects:	Intelligence tests.