Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /

International Test Conference, 1992 : proceedings.
Published: (1992)

The changing philosophy of test : International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /
Published: (1990)

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 /
Published: (1982)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

Testability concepts for digital ICs : the macro test approach /
by: Beenker, F. P. M. (Frans P. M.)
Published: (1995)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

Digital systems testing and testable design /
by: Abramovici, Miron
Published: (1990)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Proceedings International Test Conference 2002 /
Published: (2002)

Proceedings : International Test Conference 1995.
Published: (1995)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Proceedings /
Published: (1986)

Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /
Published: (2003)

Developments in integrated circuit testing /
Published: (1987)

ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA /
Published: (2001)

Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.
Published: (1989)

Design-for-test for digital IC's and embedded core systems /
by: Crouch, Alfred L.
Published: (1999)

ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA /
Published: (1999)

ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA /
Published: (2000)

Proceedings : International Test Conference 1996.
Published: (1996)

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /
Published: (1980)

Introduction to digital board testing /
by: Bennetts, R. G.
Published: (1982)

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /
Published: (1979)

Neural models and algorithms for digital testing /
by: Chakradhar, Srimat T.
Published: (1991)

Digital circuit testing : a guide to DFT and other techniques /
by: Wang, Francis C.
Published: (1991)

Proceedings /
Published: (2003)

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Published: (1985)

Random testing of digital circuits : theory and applications /
by: David, René, 1939-
Published: (1998)

Digital systems testing and testable design /
by: Abramovici, Miron
Published: (1990)

Digital circuit testing : a guide to DFT and other techniques /
by: Wang, Francis C.
Published: (1991)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2000)

Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
Published: (1987)

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Published: (1986)

Proceedings of the ... International Conference on Microelectronic Test Structures /
Published: (1989)

An engineer's guide to automated testing of high-speed interfaces /
by: Moreira, José, 1975-, et al.
Published: (2016)