Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /

Bibliographic Details
Corporate Authors: International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, [1981]
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .I593 1981
 
Call Number Status Get It
TK7874 .I593 1981 Available