Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /

Bibliographic Details
Corporate Authors:	International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, [1981]
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Automatic test equipment > Congresses.

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