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| LEADER |
00000cam a2200000 a 4500 |
| 001 |
in00000092080 |
| 005 |
20151008064143.0 |
| 008 |
820218s1981 caua b 10110 eng |
| 010 |
|
|
|a 81082806
|
| 035 |
|
|
|a (OCoLC)08242644
|
| 035 |
|
|
|9 AAK3636AM
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| 039 |
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|
|a 2
|b 3
|c 3
|d 3
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|a DLC
|c DLC
|d TXA
|d UtOrBLW
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| 049 |
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|a TXAM
|c [1502329]
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| 050 |
0 |
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|a TK7874
|b .I593 1981
|
| 082 |
0 |
|
|a 621.381/7/0287
|2 19
|
| 111 |
2 |
|
|a International Test Conference
|n (12th :
|d 1981 :
|c Philadelphia, Pa.)
|
| 245 |
1 |
0 |
|a Testing in the 1980's :
|b digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
|c sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
|
| 264 |
|
1 |
|a Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) :
|b The Society,
|c [1981]
|
| 264 |
|
4 |
|c ©1981
|
| 300 |
|
|
|a xxiv, 568 pages :
|b illustrations ;
|c 28 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 500 |
|
|
|a "IEEE catalog number 81CH1693-1."
|
| 500 |
|
|
|a "IEEE Computer Society catalog number 375."
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Electronic digital computers
|x Circuits
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Automatic test equipment
|v Congresses.
|
| 710 |
2 |
|
|a IEEE Computer Society.
|b Test Technology Committee.
|
| 710 |
2 |
|
|a Institute of Electrical and Electronics Engineers.
|b Philadelphia Section.
|
| 999 |
|
|
|a MARS
|
| 999 |
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|
| 952 |
f |
f |
|p ric
|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
|d Remote Storage
|t 0
|e TK7874 .I593 1981
|h Library of Congress classification
|i unmediated -- volume
|m A14806252301
|
| 998 |
f |
f |
|a TK7874 .I593 1981
|t 0
|l Remote Storage
|