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Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /

Bibliographic Details
Corporate Authors: International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Los Angeles, CA (P.O. Box 80452, Los Angeles 90080) : The Society, [1981]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:"IEEE catalog number 81CH1693-1."
"IEEE Computer Society catalog number 375."
Physical Description:xxiv, 568 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.