International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1981). Testing in the 1980's: Digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981. The Society.
Chicago Style (17th ed.) CitationInternational Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, and Institute of Electrical and Electronics Engineers. Philadelphia Section. Testing in the 1980's: Digest of Papers, 1981 International Test Conference, October 27, 28 & 29, 1981. Los Angeles, CA (P.O. Box 80452, Los Angeles 90080): The Society, 1981.
MLA (9th ed.) CitationInternational Test Conference Philadelphia, Pa., et al. Testing in the 1980's: Digest of Papers, 1981 International Test Conference, October 27, 28 & 29, 1981. The Society, 1981.