Tutorial : LSI testing /

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

From contamination to defects, faults, and yield loss : simulation and applications /
by: Khare, Jitendra B.
Published: (1996)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

VLSI test principles and architectures : design for testability /
Published: (2006)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Rapid reliability assessment of VLSICs /
Published: (1990)

VLSI testing /
Published: (1986)

Introduction to VLSI testing /
by: Feugate, Robert J., 1946-
Published: (1988)

VLSI testing : digital and mixed analogue/digital techniques /
by: Hurst, S. L. (Stanley Leonard)
Published: (1998)

Microcircuit device reliability : memory/digital LSI, winter 1981/82 /
by: Dey, Kieron A., et al.
Published: (1981)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Proceedings of the ... IEEE VLSI Test Symposium : VTS.

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Genetic algorithms for VLSI design, layout & test automation /
by: Mazumder, Pinaki
Published: (1999)

Unified methods for VLSI simulation and test generation /
by: Cheng, Kwang-Ting, 1961-
Published: (1989)

Testing and diagnosis of VLSI and ULSI /
Published: (1988)

Thermal-aware testing of digital VLSI circuits and systems /
by: Chattopadhyay, Santanu
Published: (2018)

High-level test synthesis of digital VLSI circuits /
by: Lee, Mike Tien-Chien
Published: (1997)

Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2002)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

IEEE VLSI Test Symposium : digest of papers.
Published: (1990)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

Formal methods for VLSI design : IFIP WG 10.5 lecture notes /
Published: (1990)

Tutorial : VLS II, the coming revolution in applications and design /
Published: (1980)

New approaches to image processing based failure analysis of nano-scale ULSI devices /
by: Zalevsky, Zeev
Published: (2014)

VLSI test principles and architectures : design for testability /
Published: (2006)

Iddq testing for CMOS VLSI /
by: Rajsuman, Rochit
Published: (1995)

Evaluation, selection and generation of Iddq tests /
by: Thadikaran, Paul J.
Published: (1996)

Delay fault testing for VLSI circuits /
by: Krstić, Angela, 1965-
Published: (1998)

Memory, microprocessor, and ASIC /
Published: (2003)

Introduction to ID̳D̳Q̳ testing /
by: Chakravarty, Sreejit
Published: (1997)

VLSI fault modeling and testing techniques /
Published: (1993)

VLSI test principles and architectures : design for testability /
Published: (2006)

Formal VLSI specification and synthesis : proceedings of the IFIP WG 10.2/WG 10.5 International Workshop on Applied Formal Methods for Correct VLSI Design /
Published: (1990)