Tutorial : LSI testing /

Bibliographic Details
Corporate Authors:	IEEE Computer Society, COMPCON
Other Authors:	Fee, Warren G.
Format:	Conference Proceeding Book
Language:	English
Published:	Long Beach, Calif. : IEEE Computer Society, [1978]
Edition:	2d ed.
Subjects:	Integrated circuits > Testing. Microprocessors > Testing. Computer storage devices > Testing. Integrated circuits > Large scale integration.

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