Tutorial : LSI testing /

Bibliographic Details
Corporate Authors: IEEE Computer Society, COMPCON
Other Authors: Fee, Warren G.
Format: Conference Proceeding Book
Language:English
Published: Long Beach, Calif. : IEEE Computer Society, [1978]
Edition:2d ed.
Subjects:

MARC

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245 0 0 |a Tutorial :  |b LSI testing /  |c [edited by] Warren G. Gee. 
250 |a 2d ed. 
264 1 |a Long Beach, Calif. :  |b IEEE Computer Society,  |c [1978] 
264 4 |c ©1978 
300 |a v, 173 pages :  |b illustrations ;  |c 28 cm. 
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500 |a "EHO 122-2." 
500 |a "Initially presented at Compcon 77, spring, San Francisco, California." 
504 |a Includes bibliographical references. 
650 0 |a Integrated circuits  |x Testing. 
650 0 |a Microprocessors  |x Testing. 
650 0 |a Computer storage devices  |x Testing. 
650 0 |a Integrated circuits  |x Large scale integration. 
700 1 |a Fee, Warren G. 
710 2 |a IEEE Computer Society. 
711 2 |a COMPCON  |n (14th :  |d 1977 :  |c San Francisco, Calif.) 
740 0 |a LSI testing. 
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