Tutorial : LSI testing /

Bibliographic Details
Corporate Authors:	IEEE Computer Society, COMPCON
Other Authors:	Fee, Warren G.
Format:	Conference Proceeding Book
Language:	English
Published:	Long Beach, Calif. : IEEE Computer Society, [1978]
Edition:	2d ed.
Subjects:	Integrated circuits > Testing. Microprocessors > Testing. Computer storage devices > Testing. Integrated circuits > Large scale integration.

Description
Item Description:	"EHO 122-2." "Initially presented at Compcon 77, spring, San Francisco, California."
Physical Description:	v, 173 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references.