Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts /
| Corporate Authors: | Society of Photo-optical Instrumentation Engineers, IEEE Industrial Electronics Society, Keisoku Jidō Seigyo Gakkai (Japan), Carnegie-Mellon University. Center for Optical Data Processing |
|---|---|
| Other Authors: | Chen, Michael J. W., Ahlers, R.-J. (Rolf-Jürgen) |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1988]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 849. |
| Subjects: |
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