Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, IEEE Industrial Electronics Society, Keisoku Jidō Seigyo Gakkai (Japan), Carnegie-Mellon University. Center for Optical Data Processing
Other Authors:	Chen, Michael J. W., Ahlers, R.-J. (Rolf-Jürgen)
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1988]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 849.
Subjects:	Computer architecture > Congresses. Pattern recognition systems > Congresses.

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