Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, IEEE Industrial Electronics Society, Keisoku Jidō Seigyo Gakkai (Japan), Carnegie-Mellon University. Center for Optical Data Processing
Other Authors: Chen, Michael J. W., Ahlers, R.-J. (Rolf-Jürgen)
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1988]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 849.
Subjects:
Description
Physical Description:vi, 274 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0892528842 (pbk.) :