Interferometric metrology : 20-21 August 1987, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors: Massie, N. A.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1988]
Series:Critical reviews of optical science and technology.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 816.
Subjects:

MARC

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245 0 0 |a Interferometric metrology :  |b 20-21 August 1987, San Diego, California /  |c N.A. Massie, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations: Applied Optics Laboratory/New Mexico State University [and others]. 
264 1 |a Bellingham, Wash., USA :  |b SPIE,  |c [1988] 
264 4 |c ©1988 
300 |a vi, 239 pages :  |b illustrations ;  |c 28 cm. 
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500 |a "...part of a four-conference program...held at SPIE's 31st Annual International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering. The other conferences were conferences 814, 815, 817." 
504 |a Includes bibliographical references and author index. 
650 0 |a Laser speckle  |x Congresses. 
650 0 |a Optical measurements  |v Congresses. 
650 0 |a Interferometry  |v Congresses. 
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710 2 |a New Mexico State University.  |b Applied Optics Laboratory. 
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