Interferometric metrology : 20-21 August 1987, San Diego, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors:	Massie, N. A.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1988]
Series:	Critical reviews of optical science and technology. Proceedings of SPIE--the International Society for Optical Engineering ; v. 816.
Subjects:	Laser speckle > Congresses. Optical measurements > Congresses. Interferometry > Congresses.

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