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Interferometric metrology : 20-21 August 1987, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors: Massie, N. A.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1988]
Series:Critical reviews of optical science and technology.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 816.
Subjects:
Laser speckle > Congresses.
Optical measurements > Congresses.
Interferometry > Congresses.
Description
Item Description:"...part of a four-conference program...held at SPIE's 31st Annual International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering. The other conferences were conferences 814, 815, 817."
Physical Description:vi, 239 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and author index.
ISBN:0892528516 (pbk.) :