Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida /

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

VLSI high-speed I/O circuits : theoretical basis, architecture, modeling and circuit implementation /
by: Song, Hongjiang
Published: (2009)

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

Proceedings : IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits : August 2-4, 1993, Cornell University, Ithaca, New York /
Published: (1993)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Third Caltech Conference on Very Large Scale Integration : [papers] /
Published: (1983)

VLSI 93 : proceedings of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, Grenoble, France, 7-10 September, 1993 /
Published: (1994)

Design methodologies for VLSI circuits /
Published: (1982)

Introduction to VLSI silicon devices : physics, technology, and characterization /
by: El-Kareh, Badih
Published: (1986)

Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits : August 10-12, 1987, Cornell University, Ithaca, New York /
Published: (1987)

Proceedings : IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits : August 4,5 & 6, 1997, Cornell University, Ithaca, New York /
Published: (1997)

Very large scale integration (VLSI) : fundamentals and applications /
Published: (1982)

VLSI circuits and systems : 19-21 May 2003, Maspalomas, Gran Canaria, Spain /
Published: (2003)

Yield simulation for integrated circuits /
by: Walker, Duncan Moore Henry
Published: (1987)

VLSI circuits and systems II : 9-11 May 2005, Seville, Spain /
Published: (2005)

The bounding approach to VLSI circuit simulation /
by: Zukowski, Charles A.
Published: (1986)

1990 Symposium on VLSI Circuits : digest of technical papers : June 7-9, 1990, Honolulu /
Published: (1990)

1991 Symposium on VLSI Circuits : digest of technical papers : May 30-June 1, 1991, Oiso /
Published: (1991)

Very-Large-Scale Integration Physical Design : Engineering Change Order and Timing Design Rule Check.
by: Yeap, Kim Ho
Published: (2025)

Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 /
Published: (1986)

Materials and process characterization for VLSI, 1988 (ICMPC '88) : proceedings of the international conference : Oct. 24-29, 1988, Shanghai, China /
Published: (1988)

Mixed analog-digital VLSI devices and technology : an introduction /
by: Tsividis, Yannis
Published: (1996)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Proceedings /
Published: (1996)

The design and analysis of VLSI circuits /
by: Glasser, Lance A.
Published: (1985)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

Rapid reliability assessment of VLSICs /
Published: (1990)

VLSI test principles and architectures : design for testability /
Published: (2006)

VLSI Analog Circuits : Algorithms, Architecture, Modeling, and Circuit Implementation /
by: Song, Hongjiang
Published: (2016)

Low-voltage SOI CMOS VLSI devices and circuits /
by: Kuo, James B., 1956-
Published: (2001)

Low-voltage SOI CMOS VLSI devices and circuits /
by: Kuo, James B., 1956-
Published: (2001)

Research on integrated systems : proceedings of the 1993 symposium /
Published: (1993)

Integrated circuits : chemical and physical processing : developed from the winter symposium /
Published: (1985)

1996 Symposium on VLSI Circuits : digest of technical papers, June 13-15, 1996, Honolulu /
Published: (1996)