Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Jain, Ravi
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1987]
Series:	Critical reviews of optical science and technology. Proceedings of SPIE--the International Society for Optical Engineering ; v. 795.
Subjects:	Semiconductors > Congresses. Very high speed integrated circuits > Congresses. Integrated circuits > Very large scale integration > Congresses.

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