Cover Image

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Jain, Ravi
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1987]
Series:Critical reviews of optical science and technology.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 795.
Subjects:
Semiconductors > Congresses.
Very high speed integrated circuits > Congresses.
Integrated circuits > Very large scale integration > Congresses.
Description
Physical Description:x, 359 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and author index.
ISBN:0892528303 (pbk.) :