Society of Photo-optical Instrumentation Engineers & Jain, R. (1987). Characterization of very high speed semiconductor devices and integrated circuits: 23-25 March 1987, Bay Point, Florida. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Ravi Jain. Characterization of Very High Speed Semiconductor Devices and Integrated Circuits: 23-25 March 1987, Bay Point, Florida. Bellingham, Wash., USA: SPIE, 1987.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Ravi Jain. Characterization of Very High Speed Semiconductor Devices and Integrated Circuits: 23-25 March 1987, Bay Point, Florida. SPIE, 1987.
Warning: These citations may not always be 100% accurate.