Developments in integrated circuit testing /

Digital integrated circuits : design-for-test using Simulink and Stateflow /
by: Perelroyzen, Evgeni
Published: (2007)

Digital circuit testing : a guide to DFT and other techniques /
by: Wang, Francis C.
Published: (1991)

Random testing of digital circuits : theory and applications /
by: David, René, 1939-
Published: (1998)

Introduction to digital board testing /
by: Bennetts, R. G.
Published: (1982)

Digital systems testing and testable design /
by: Abramovici, Miron
Published: (1990)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2000)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Fault diagnosis of digital circuits /
by: I︠A︡rmolik, V. N. (Vi︠a︡cheslav Nikolaevich)
Published: (1990)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

Proceedings : International Test Conference 1996.
Published: (1996)

Digital integrated circuits : design-for-test using Simulink and Stateflow /
by: Perelroyzen, Evgeni
Published: (2007)

Automatic testing and evaluation of digital integrated circuits /
by: Healy, James T., 1940-
Published: (1981)

Thermal-aware testing of digital VLSI circuits and systems /
by: Chattopadhyay, Santanu
Published: (2018)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

A unified approach for timing verification and delay fault testing /
by: Sivaraman, Mukund, 1970-
Published: (1998)

Introduction to ID̳D̳Q̳ testing /
by: Chakravarty, Sreejit
Published: (1997)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

An introduction to logic circuit testing /
by: Lala, Parag K., 1948-
Published: (2009)

Handbook of quality integrated circuit manufacturing /
by: Zorich, Robert
Published: (1991)

Fault diagnosis of analog integrated circuits /
by: Kabisatpathy, Prithviraj
Published: (2005)

Digital integrated circuit design using verilog and systemverilog /
by: Mehler, Ronald
Published: (2015)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

Digital integrated circuits : analysis and design /
by: Ayers, John E.
Published: (2010)

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /
Published: (1985)

Thermal testing of integrated circuits /
by: Altet, Josep
Published: (2002)

Testability concepts for digital ICs : the macro test approach /
by: Beenker, F. P. M. (Frans P. M.)
Published: (1995)

Principles of semiconductor network testing /
by: Afshar, Amir
Published: (1995)

Fault diagnosis of analog integrated circuits /
by: Kabisatpathy, Prithviraj
Published: (2005)

High-level test synthesis of digital VLSI circuits /
by: Lee, Mike Tien-Chien
Published: (1997)

Proceedings : International Test Conference 1995.
Published: (1995)

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
Published: (1981)

Digital integrated circuit design using verilog and systemverilog /
by: Mehler, Ronald
Published: (2015)