Developments in integrated circuit testing /

Bibliographic Details
Other Authors:	Miller, D. Michael
Format:	Book
Language:	English
Published:	London ; San Diego : Academic Press, ©1987.
Series:	Perspectives in computing (Boston, Mass.) ; vol. 18.
Subjects:	Integrated circuits > Testing. Digital integrated circuits > Testing > Congresses. Circuits intégrés numériques > Essais > Congrès. Digital integrated circuits > Testing Integrated circuits > Testing Integrierte Schaltung Prüftechnik Conference papers and proceedings

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