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|a Developments in integrated circuit testing /
|c D.M. Miller, editor.
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|a London ;
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|b Academic Press,
|c ©1987.
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|a Perspectives in computing ;
|v vol. 18
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|a Includes bibliographical references (pages 407-431).
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|a Also issued online.
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|a Miller, D. Michael.
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|i Online version:
|t Developments in integrated circuit testing.
|d London ; San Diego : Academic Press, ©1987
|w (OCoLC)568663221
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| 830 |
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|a Perspectives in computing (Boston, Mass.) ;
|v vol. 18.
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