Developments in integrated circuit testing /

Bibliographic Details
Other Authors:	Miller, D. Michael
Format:	Book
Language:	English
Published:	London ; San Diego : Academic Press, ©1987.
Series:	Perspectives in computing (Boston, Mass.) ; vol. 18.
Subjects:	Integrated circuits > Testing. Digital integrated circuits > Testing > Congresses. Circuits intégrés numériques > Essais > Congrès. Digital integrated circuits > Testing Integrated circuits > Testing Integrierte Schaltung Prüftechnik Conference papers and proceedings

Description
Physical Description:	x, 440 pages : illustrations ; 24 cm Also issued online.
Bibliography:	Includes bibliographical references (pages 407-431).
ISBN:	0124967353 9780124967359