Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27- 29, 1987 /
| Corporate Author: | International Symposium on Defect Recognition and Image Processing in III-V Compounds Monterey, Calif. |
|---|---|
| Other Authors: | Weber, Eicke R. |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam ; New York :
Elsevier,
1987.
|
| Series: | Materials science monographs ;
44. |
| Subjects: |
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