Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27- 29, 1987 /

Bibliographic Details
Corporate Author:	International Symposium on Defect Recognition and Image Processing in III-V Compounds Monterey, Calif.
Other Authors:	Weber, Eicke R.
Format:	Conference Proceeding Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1987.
Series:	Materials science monographs ; 44.
Subjects:	Semiconductors > Defects > Congresses. Gallium arsenide semiconductors > Congresses. Image processing > Congresses.

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