Cover Image

Yield simulation for integrated circuits /

Show other versions (1)
Bibliographic Details
Main Author: Walker, Duncan Moore Henry
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1987]
Series:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Mathematical models.
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Defects > Mathematical models.
Integrated circuits > Very large scale integration > Defects > Data processing.
Monte Carlo method.

Similar Items