Yield simulation for integrated circuits /

Bibliographic Details
Main Author:	Walker, Duncan Moore Henry
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1987]
Series:	Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Mathematical models. Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Defects > Mathematical models. Integrated circuits > Very large scale integration > Defects > Data processing. Monte Carlo method.

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