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Yield simulation for integrated circuits /

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Bibliographic Details
Main Author: Walker, Duncan Moore Henry
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1987]
Series:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Mathematical models.
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Defects > Mathematical models.
Integrated circuits > Very large scale integration > Defects > Data processing.
Monte Carlo method.
Description
Item Description:Based on author's thesis (Ph. D.).
Includes index.
Physical Description:x, 209 pages : illustrations ; 25 cm.
Bibliography:Bibliography: pages [189]-206.
ISBN:0898382440