Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /

Principles of semiconductor network testing /
by: Afshar, Amir
Published: (1995)

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
Published: (1974)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2000)

Integrated circuit manufacturability : the art of process and design integration /
Published: (1999)

Memory & LSI : digest of papers /
Published: (1977)

Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.
Published: (1989)

Proceedings of the ... International Conference on Microelectronic Test Structures /
Published: (1989)

International Test Conference, 1992 : proceedings.
Published: (1992)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

The changing philosophy of test : International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /
Published: (1990)

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /
Published: (1980)

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
Published: (1981)

Delay fault testing for VLSI circuits /
by: Krstić, Angela, 1965-
Published: (1998)

Meeting the tests of time : International Test Conference, 1989 proceedings, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC /
Published: (1989)

The three faces of test : design, characterization, production : proceedings /
Published: (1984)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

Proceedings International Test Conference 2002 /
Published: (2002)

Electron microscopy of semiconducting materials and ULSI devices : symposium held April 15-16, 198, San Francisco, California, U.S.A. /
Published: (1998)

Thermal testing of integrated circuits /
by: Altet, Josep
Published: (2002)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Proceedings, International Test Conference 1998.
Published: (1998)

Design to test : a definitive guide for electronic design, manufacture, and service /
by: Turino, Jon L.
Published: (1990)

Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /
Published: (2003)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /
Published: (1979)

Digital systems testing and testable design /
by: Abramovici, Miron
Published: (1990)

Automatic testing and evaluation of digital integrated circuits /
by: Healy, James T., 1940-
Published: (1981)

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /
Published: (1985)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

Proceedings : International Test Conference 1996.
Published: (1996)

Introduction to digital board testing /
by: Bennetts, R. G.
Published: (1982)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)