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Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /

Bibliographic Details
Corporate Authors: International Test Conference Washington, D.C., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : IEEE Computer Society Press, [1987]
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .I593 1987
 
Call Number Status Get It
TK7874 .I593 1987 Available