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First Indicator |
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Subfields |
| LEADER |
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| 001 |
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| 005 |
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| 008 |
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| 010 |
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|a 87080439
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|a 081860798X (pbk.)
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| 020 |
|
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|a 0818647981 (microfiche)
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| 050 |
|
4 |
|a TK7874
|b .I593 1987
|
| 111 |
2 |
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|a International Test Conference
|d (1987 :
|c Washington, D.C.)
|
| 245 |
1 |
0 |
|a Integration of test with design and manufacturing :
|b International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
|c sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
|
| 264 |
|
1 |
|a Washington, D.C. :
|b IEEE Computer Society Press,
|c [1987]
|
| 264 |
|
4 |
|c ©1987
|
| 300 |
|
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|a xxxi, 1151 pages :
|b illustrations ;
|c 28 cm.
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 504 |
|
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|a Includes bibliographies and index.
|
| 500 |
|
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|a "IEEE catalog number 87CH2347-2."
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Semiconductors
|x Testing
|v Congresses.
|
| 710 |
2 |
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|a IEEE Computer Society.
|
| 710 |
2 |
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|a Institute of Electrical and Electronics Engineers.
|b Philadelphia Section.
|
| 999 |
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|a MARS
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|a Texas A&M University
|b Rellis Campus
|c Joint Library Facility
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|e TK7874 .I593 1987
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