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Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /

Bibliographic Details
Corporate Authors: International Test Conference Washington, D.C., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : IEEE Computer Society Press, [1987]
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Description
Item Description:"IEEE catalog number 87CH2347-2."
Physical Description:xxxi, 1151 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:081860798X (pbk.)
0818647981 (microfiche)
0818687983 (hard)