APA (7th ed.) Citation

International Test Conference Washington, D.C., IEEE Computer Society, & Institute of Electrical and Electronics Engineers. Philadelphia Section. (1987). Integration of test with design and manufacturing: International Test Conference, 1987, proceedings, September 1, 2, 3, 1987. IEEE Computer Society Press.

Chicago Style (17th ed.) Citation

International Test Conference Washington, D.C., IEEE Computer Society, and Institute of Electrical and Electronics Engineers. Philadelphia Section. Integration of Test with Design and Manufacturing: International Test Conference, 1987, Proceedings, September 1, 2, 3, 1987. Washington, D.C.: IEEE Computer Society Press, 1987.

MLA (9th ed.) Citation

International Test Conference Washington, D.C., et al. Integration of Test with Design and Manufacturing: International Test Conference, 1987, Proceedings, September 1, 2, 3, 1987. IEEE Computer Society Press, 1987.