Coherent electron microscopy : designing faster and brighter electron sources.
This book focuses on advances in imaging and electron physics, specifically the development of coherent electron microscopy. It covers the principles and technological advancements in field emission transmission electron microscopy (FE-TEM) and cold field emission electron sources, including the des...
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| Format: | eBook |
| Language: | English |
| Published: |
Amsterdam, Netherlands ; Cambridge, MA :
Elsevier,
2023.
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| Series: | Advances in imaging and electron physics ;
227 |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- Front Cover
- Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources
- Copyright
- Dedication
- Contents
- Acronyms
- Symbols
- Preface
- Chapter One: Characterization of nanomaterials properties using FE-TEM
- 1.1. Principles of physical characterization using a coherent electron beam
- 1.1.1. The transmission electron microscope: An introduction
- 1.1.2. The complementarity of the wave approach
- 1.1.2.1. Geometrical wavefronts in conventional optics
- 1.1.2.2. Geometrical wavefronts in charged particle optics
- 1.1.2.3. The Aharonov-Bohm effect and off-axis electron holography
- 1.1.2.3.1. Principle of interferometry
- 1.1.2.3.2. Principle of electron holography
- 1.1.2.3.3. The Aharonov-Bohm effect
- 1.1.2.3.4. Consequence for material sciences
- 1.1.3. Key instrumental figures in TEM
- 1.1.3.1. Influence of geometrical aberrations of lenses
- 1.1.3.1.1. TEM imaging in the presence of aberrations
- 1.1.3.1.2. STEM imaging in the presence of aberrations
- 1.1.3.2. The source and the electron coherence
- 1.1.3.3. Additional aberrations and parasitic effects
- 1.1.3.3.1. Chromatic aberration
- 1.1.3.3.2. Parasitic aberrations
- 1.1.3.3.3. Instrument instabilities
- 1.1.3.3.4. Biprism artefacts specific to electron holography
- 1.1.4. Summary and discussion