http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
1 online resource (xvii, 502 pages) : illustrations (some color).
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource.
First principles -- Complete lattices -- Operators on complete lattices -- Operators which are translation invariant -- Adjunctions, dilations, and erosions -- Openings and closings -- Hit-or-miss topology and semi-continuity -- Discretization -- Convexity, distance, and connectivity -- Lattice representations of functions -- Morphology for grey-scale images -- Morphological filters -- Filtering and iteration.
Henk J.A.M. Heijmans ; edited by Martin Hÿtch and Peter W. Hawkes, CEMES-CNRS, Toulouse, France.
"Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains."--Publisher's web page, viewed September 1, 2020
Includes bibliographical references and index.
London, United Kingdom : Academic Press, an imprint of Elsevier, [2020]
Advances in imaging and electron physics ; v. 216