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Advances in imaging and electron physics
Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.- Contains contributions from leading authorities on the subject matter- Informs and updates on the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing.
Front Cover -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- 1 Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons -- 1 Introduction -- 2 Image formation in the transmission electron microscope -- 2.1 Modeling the TEM -- 2.2 A short introduction to the Dirac equation -- 2.3 Mathematics of the imaging process -- 2.3.1 Pre-specimen -- 2.3.2 Post-specimen -- 3 The multislice method -- 3.1 The conventional multislice algorithm -- 3.1.1 Algorithm for elastically scattered electrons -- 3.1.2 Incorporating inelastically scattered electrons -- 3.2 A relativistic multislice algorithm -- 3.2.1 The Dirac equation in its two-component form -- 3.2.2 Algorithm for elastically scattered electrons -- 3.2.3 The relativistic Yoshioka equations -- 3.2.4 Incorporating inelastically scattered electrons -- 3.3 Transition potentials of atomic inner-shell ionizations -- 3.3.1 Conventional result -- 3.3.2 Relativistic result -- 4 Implementation -- 4.1 The incident wave function -- 4.2 Elastic electron scattering -- 4.3 Inner-shell ionizations -- 4.3.1 The transition function -- 4.3.2 The projected transition potential -- 4.3.3 Radial wave functions of the atomic electron -- 4.4 Electron-phonon scattering -- 4.5 Convergence of the incident electron beam -- 5 Results and discussion -- 5.1 Comparisons to single atom calculations -- 5.1.1 Ratio of ionization cross sections -- 5.1.2 Inelastic transfer function -- 5.2 Simulation of EFTEM elemental maps -- 5.2.1 Dipole-forbidden transitions -- 5.2.2 Elemental maps of SrTiO3[110] -- 5.2.3 Elemental maps of Si[110] -- 5.3 A simpler relativistic multislice algorithm -- 5.3.1 A simpler transmission function -- 5.3.2 A simpler transition function -- 5.3.3 The simpli ed algorithm -- 5.4 Impact of the electron spin.
Acknowledgment -- References -- 3 Electron energy loss spectroscopy in the electron microscope -- 1 Introduction -- 2 Fundamentals of inelastic scattering -- 2.1 General instrumental considerations -- 2.2 Some useful de nitions -- 2.3 The physics of elementary excitations -- 2.3.1 General classi cation -- 2.3.2 The recovery of single loss spectra -- 3 The low-energy loss region: plasmons and interband transitions -- 3.1 Energy dependence -- 3.2 Angular dependence -- 4 High-energy loss region: inner shell excitations -- 4.1 Bethe theory for inelastic scattering by an isolated atom -- 4.1.1 Angular distribution -- 4.1.2 Energy distribution -- 4.1.3 Partially integrated cross-sections -- 4.2 Fine structures due to various solid-state effects -- 4.2.1 Generalities -- 4.2.2 Chemical shift and edge shape -- 4.2.3 Band structure effects and ELNES -- 4.2.4 Extended ne structures (EXELFS) -- 4.3 Some problems in the intermediate energy loss domain -- 4.3.1 Background -- 4.3.2 Core loss excitations in the 20-50 eV energy loss domain -- 5 Developments in instrumentation -- 5.1 Classi cation of various systems -- 5.1.1 CTEM with energy-loss lters -- 5.1.2 STEM with energy-loss spectrometers -- 5.2 The scanning transmission microscope -- 5.3 Spectrometer design and coupling -- 5.3.1 Qualities of a spectrometer: Theory and application -- 5.3.2 Coupling of the spectrometer to the microscope column -- 5.4 Detection unit -- 5.5 Data acquisition and processing -- 6 EELS as a microanalytical tool -- 6.1 Qualitative microanalysis -- 6.1.1 Library of useful edges -- 6.1.2 Examples of applications -- 6.2 Quantitative microanalysis -- 6.2.1 De nitions: Signal and cross-section -- 6.2.2 Specimen induced effects -- 6.3 Detection limits -- 6.3.1 Minimum detectable mass -- 6.3.2 Minimum detectable mass fraction (MMF) -- 6.4 Environmental information.
6.5 Chemical mapping with energy ltered images -- 7 Miscellaneous -- 7.1 Electron energy loss spectroscopy in high voltage microscopy -- 7.2 Energy ltered images -- 7.3 Energy losses on surfaces at glancing incidence -- Acknowledgements -- Post scriptum -- References -- Further reading -- Index -- Back Cover.
edited by Peter W. Hawkes, Martin Hÿtch.
Advances in imaging and electron physics ; v. 211