rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Quantitative Data Processing in Scanning Probe Microscopy
    sub title: SPM Applications for Nanometrology
  name:
    name part: Klapetek, Petr.
    role:
      role term: creator
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: cau
    date issued: 2018
    edition: 2nd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (422 pages)
  abstract: Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm.
  table of contents: Intro; Title page; Table of Contents; Copyright; List of Contributors; Preface to the Second Edition; Preface to the First Edition; Chapter 1: Motivation; Abstract; 1.1. Why â#x80;#x9C;Quantitativeâ#x80;#x9D; Scanning Probe Microscopy?; 1.2. What Is Scanning Probe Microscopy?; 1.3. Basic Metrology Concepts; 1.4. Scanning Probe Microscopy and Quantitative Measurements; References; Chapter 2: Instrumentation Principles; Abstract; 2.1. Few Components for a Price of a House?; 2.2. Novel Approaches; References; Chapter 3: Data Models; Abstract; 3.1. From Analog to Digital; 3.2. Data Acquisition Basics
  table of contents: 3.3. Image Sampling3.4. Data Storage; 3.5. Mechanical and Thermal Drifts; 3.6. Noise; 3.7. Try It Yourself; 3.8. Tips and Tricks; References; Chapter 4: Basic Data Processing; Abstract; 4.1. A Daily Bread?; 4.2. Data Visualization; 4.3. Local Data Manipulation; 4.4. Global Data Manipulation; 4.5. Multiple Channel Operations; 4.6. Scripting; 4.7. Data Generation; 4.8. Other Freely Available Data Processing Software; 4.9. Uncertainty Related to Data Processing; 4.10. Try It Yourself; 4.11. Tips and Tricks; References; Chapter 5: Dimensional Measurements; Abstract; 5.1. The Easiest Measurement?
  table of contents: 5.2. Atomic Force Microscopy Principles5.3. Atomic Force Microscopy Dimensional Data Measurement and Evaluation; 5.4. Atomic Force Microscopy and Quantitative Dimensional Metrology; 5.5. Try It Yourself; 5.6. Tips and Tricks; References; Chapter 6: Force and Mechanical Properties; Abstract; 6.1. What About Forces in Force Microscopy?; 6.2. Forces and Forceâ#x80;#x93;Distance Curves; 6.3. Force Interaction Modeling; 6.4. Quantitative Force Measurements; 6.5. Local Mechanical and Material Properties Mapping; 6.6. Try It Yourself; 6.7. Tips and Tricks; References; Chapter 7: Friction and Lateral Forces
  table of contents: Abstract7.1. What Opposes the Tip Motion?; 7.2. Friction Forces; 7.3. Force Modeling; 7.4. Quantitative Friction Force Measurements; 7.5. Special Modes; 7.6. Try It Yourself; 7.7. Tips and Tricks; References; Chapter 8: Electrostatic Fields; Abstract; 8.1. What Is Above the Sample? See the Invisible!; 8.2. Basic Relations; 8.3. Numerical Modeling; 8.4. Try It Yourself; 8.5. Tips and Tricks; References; Chapter 9: Magnetic Fields; Abstract; 9.1. Magnetic Field Measurements; 9.2. Try It Yourself; 9.3. Tips and Tricks; References; Chapter 10: Local Current Measurements; Abstract
  table of contents: 10.1. Where It All Started10.2. Tipâ#x80;#x93;Sample Junction Models; 10.3. Scanning Tunneling Microscopy and Related Methods; 10.4. Conductive Atomic Force Microscopy; 10.5. Piezoresponse Force Microscopy; 10.6. Scanning Electrochemical Microscopy; 10.7. Try It Yourself; 10.8. Tips and Tricks; References; Chapter 11: Thermal Measurements; Abstract; 11.1. Really a Hot Topic?; 11.2. Nano- and Microscale Heat Flow; 11.3. Instrumentation; 11.4. Data Interpretation; 11.5. Try It Yourself; 11.6. Tips and Tricks; References; Chapter 12: Optical Measurements; Abstract; 12.1. Have a Look at Nanoscale
  note: 12.2. Fundamental Phenomena
  note: Includes bibliographical references and index.
  subject:
    topic: Scanning probe microscopy
  subject:
    topic: Nanostructures
    topic: Measurement
  subject:
    topic: Microscopy, Scanning Probe
  subject:
    topic: Microscopie à sonde à balayage
  subject:
    topic: SCIENCE
    topic: General
  subject:
    topic: Scanning probe microscopy
  classification: QH212.S33 .K53 2018
  classification: 502.82
  related item:
    title info:
      title: Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology
    name:
      name part: Klapetek, Petr.
    origin info:
      publisher: San Diego : Elsevier Science, ©2018
  related item:
    title info:
      title: Micro & nano technologies
  identifier: 9780128133484
  identifier: 0128133481
  identifier: 0128133473
  identifier: 9780128133477
  identifier: 9780128133484 Ingram Content Group
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: EBLCP
    record creation date: 180127
    record change date: 20260327153020.1
    record identifier: in00005762901
    language of cataloging:
      language term: eng