Principles of electron optics. Volume two, Applied geometrical optics /

Bibliographic Details
Main Authors: Hawkes, P. W. (Author), Kasper, E. (Erwin), 1933- (Author)
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: London : Academic Press, an imprint of Elsevier, [2018]
Edition:Second edition.
Subjects:
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Pt. VII Instrumental Optics
  • ch. 35 Electrostatic Lenses
  • 35.1.Introduction
  • 35.2.Immersion Lenses
  • 35.2.1.The Single Aperture
  • 35.2.2.The Two-Electrode Lens
  • 35.2.3.Three or More Electrodes
  • 35.3.Einzel Lenses
  • 35.3.1.The Principal Potential Models
  • 35.3.2.Measurements and Exact Calculations
  • 35.3.3.Miniature Lenses
  • 35.4.Grid or Foil Lenses
  • 35.5.Conical Lenses and Coaxial Lenses
  • 35.6.Cylindrical Lenses
  • ch. 36 Magnetic Lenses
  • 36.1.Introduction
  • 36.1.1.Modes of Operation
  • 36.1.2.Practical Design
  • 36.1.3.Notation
  • 36.2.Field Models
  • 36.2.1.Symmetric Lenses: Glaser's Bell-Shaped Model
  • 36.3.Related Bell-Shaped Curves
  • 36.3.1.The Grivet
  • Lenz Model
  • 36.3.2.The Exponential Model
  • 36.3.3.The Power Law Model
  • 36.3.4.The Convolutional Models
  • 36.3.5.A Generalized Model
  • 36.3.6.Unsymmetric Lenses
  • 36.3.7.Hahn's Procedure
  • 36.3.8.Other Models
  • 36.4.Measurements and Universal Curves
  • 36.4.1.Introduction
  • 36.4.2.Unsaturated Lenses
  • 36.4.3.Saturated Lenses
  • 36.5.Ultimate Lens Performance
  • 36.5.1.Tretner's Analysis
  • 36.5.2.Earlier Studies
  • 36.5.3.Optimization
  • 36.6.Lenses of Unusual Geometry
  • 36.6.1.Mini-Lenses, Pancake Lenses and Single-Polepiece Lenses
  • 36.6.2.Laminated Lenses
  • 36.7.Special Purpose Lenses
  • 36.7.1.Unsymmetrical Round Lenses
  • 36.7.2.Superconducting Shielding Lenses or Cryolenses
  • 36.7.3.Permanent-Magnet Lenses
  • 36.7.4.Triple-Polepiece Projector Lenses
  • 36.7.5.Objective Lens with Low Magnetic Field at the Specimen Capable of Good Resolution
  • 36.7.6.Probe-Forming Lenses for Low-Voltage Scanning Electron Microscopes
  • 36.7.7.Hybrid TEM
  • STEM Operation: the Twin and Super-Twin Geometries
  • 36.7.8.The Lotus-Root Multibeam Lens
  • ch. 37 Electron Mirrors, Low-Energy-Electron Microscopes and Photoemission Electron Microscopes, Cathode Lenses and Field-Emission Microscopy
  • 37.1.The Electron Mirror Microscope
  • 37.2.Mirrors in Energy Analysis
  • 37.3.Cathode Lenses, Low-Energy-Electron Microscopes and Photoemission Electron Microscopes
  • 37.4.Field-Emission Microscopy
  • 37.5.Ultrafast Electron Microscopy
  • ch. 38 The Wien Filter
  • ch. 39 Quadrupole Lenses
  • 39.1.Introduction
  • 39.2.The Rectangular and Bell-Shaped Models
  • 39.3.Isolated Quadrupoles and Doublets
  • 39.4.Triplets
  • 39.5.Quadruplets
  • 39.6.Other Quadrupole Geometries
  • 39.6.1.Arc Lenses
  • 39.6.2.Crossed Lenses
  • 39.6.3.Biplanar Lenses
  • 39.6.4.Astigmatic Tube Lenses
  • 39.6.5.Transaxial Lenses
  • 39.6.6.Radial Lenses
  • ch. 40 Deflection Systems
  • 40.1.Introduction
  • 40.2.Field Models for Magnetic Deflection Systems
  • 40.2.1.Field of a Closed Loop in Free Space
  • 40.2.2.Approximate Treatment of Ferrite Shields
  • 40.2.3.The Axial Harmonics
  • 40.3.The Variable-Axis Lens
  • 40.3.1.Theoretical Considerations
  • 40.3.2.Practical Design
  • 40.4.Alternative Concepts
  • 40.5.Deflection Modes and Beam-Shaping Techniques
  • pt. VIII Aberration Correction and Beam Intensity Distribution (Caustics)
  • ch. 41 Aberration Correction
  • 41.1.Introduction
  • 41.2.Multipole Correctors
  • 41.2.1.Quadrupoles and Octopoles
  • 41.2.2.Sextupole Optics and Sextupole Correctors
  • 41.2.3.Practical Designs
  • 41.2.4.Measurement of Aberrations
  • 41.3.Foil Lenses and Space Charge
  • 41.3.1.Space Charge Clouds
  • 41.3.2.Foil Lenses
  • 41.4.Axial Conductors
  • 41.5.Mirrors
  • 41.6.High-Frequency Lenses
  • 41.6.1.Spherical Correction
  • 41.6.2.Chromatic Correction
  • 41.7.Other Aspects of Aberration Correction
  • 41.8.Concluding Remarks
  • ch. 42 Caustics and Their Uses
  • 42.1.Introduction
  • 42.2.The Concept of the Caustic
  • 42.3.The Caustic of a Round Lens
  • 42.4.The Caustic of an Astigmatic Lens
  • 42.5.Intensity Considerations
  • 42.6.Higher Order Focusing Properties
  • 42.7.Applications of Annular Systems
  • pt. IX Electron Guns
  • ch. 43 General Features of Electron Guns
  • 43.1.Thermionic Electron Guns
  • 43.2.Schottky Emission Guns
  • 43.3.Cold Field Electron Emission Guns
  • 43.4.Beam Transport Systems
  • ch. 44 Theory of Electron Emission
  • 44.1.General Relations
  • 44.2.Transmission Through a Plane Barrier
  • 44.3.Thermionic Electron Emission
  • 44.4.The Tunnel Effect
  • 44.5.Field Electron Emission
  • 44.6.Schottky Emission
  • 44.7.Concluding Remarks
  • ch. 45 Pointed Cathodes Without Space Charge
  • 45.1.The Spherical Cathode
  • 45.2.The Diode Approximation
  • 45.3.Field Calculation in Electron Sources with Pointed Cathodes
  • 45.3.1.Analytic Field Models
  • 45.3.2.Rigorous Methods
  • 45.4.Simple Models
  • 45.4.1.A Diode-Field Model
  • 45.4.2.Thermionic Triode Guns
  • ch. 46 Space Charge Effects
  • 46.1.The Spherical Diode
  • 46.2.Asymptotic Properties and Generalizations
  • 46.3.Determination of the Space Charge
  • 46.4.The Boersch Effect
  • 46.4.1.Introduction
  • 46.4.2.The Shift of the Mean Energy
  • 46.4.3.Thermodynamic Considerations
  • 46.4.4.Analytical Calculations
  • ch. 47 Brightness
  • 47.1.Application of Liouville's Theorem
  • 47.2.The Maximum Brightness
  • 47.3.The Influence of Apertures
  • 47.4.Lenz's Brightness Theory
  • 47.4.1.Rotationally Symmetric Electrostatic Fields
  • 47.4.2.The Generalized Theory
  • 47.5.Measurement of the Brightness
  • 47.6.Coulomb Interactions and Brightness
  • 47.7.Aberrations in the Theory of Brightness
  • ch. 48 Emittance
  • 48.1.Trace Space and Hyperemittance
  • 48.2.Two-Dimensional Emittances
  • 48.2.1.General Emittance Ellipses
  • 48.2.2.Acceptance and Matching
  • 48.3.Brightness and Emittance
  • 48.4.Emittance Diagrams
  • ch. 49 Gun Optics
  • 49.1.The Fujita
  • Shimoyama Theory
  • 49.2.Rose's Theory
  • 49.3.Matching the Paraxial Approximation to a Cathode Surface
  • ch. 50 Complete Electron Guns
  • 50.1.Justification of the Point Source Model
  • 50.2.The Lens System in Field-Emission Devices
  • 50.3.Hybrid Emission
  • 50.4.Conventional Thermionic Guns
  • 50.5.Pierce Guns
  • 50.6.Multi-electron-beam Systems
  • 50.7.Carbon Nanotube Emitters
  • 50.8.Further Reading
  • pt. X Systems with a Curved Optic Axis
  • ch. 51 General Curvilinear Systems
  • 51.1.Introduction of a Curvilinear Coordinate System
  • 51.2.Series Expansion of the Potentials and Fields
  • 51.3.Variational Principle and Trajectory Equations
  • 51.4.Simplifying Symmetries
  • 51.5.Trajectory Equations for Symmetric Configurations
  • 51.6.Aberration Theory
  • 51.6.1.Magnetic Systems
  • 51.6.2.Compound Systems
  • ch. 52 Sector Fields and Their Applications
  • 52.1.Introduction
  • 52.2.Magnetic Devices with a Circular Optic Axis
  • 52.3.Radial (Horizontal) Focusing for a Particular Model Field
  • 52.4.The Linear Dispersion
  • 52.5.The Axial (Vertical) Focusing
  • 52.6.Fringing Field Effects
  • 52.7.Aberration Theory: The Homogeneous Magnetic Field (n = 0)
  • 52.8.Optimization Procedures
  • 52.8.1.Single Deflection Prisms
  • 52.8.2.Use of Symmetries
  • 52.9.Energy Analysers and Monochromators
  • 52.9.1.Introduction
  • 52.9.2.In-column Energy Analysers
  • 52.9.3.Details of the Various Filters
  • 52.9.4.The Mollenstedt and Ichinokawa Analysers
  • 52.9.5.Postcolumn Spectrometers
  • 52.9.6.Monochromators
  • ch. 53 Unified Theories of Ion Optical Systems
  • 53.1.Introduction
  • 53.2.Electrostatic Prisms
  • 53.3.A Unified Version of the Theory
  • 53.4.The Literature of Ion Optics.