http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Pt. VII Instrumental Optics -- ch. 35 Electrostatic Lenses -- 35.1.Introduction -- 35.2.Immersion Lenses -- 35.2.1.The Single Aperture -- 35.2.2.The Two-Electrode Lens -- 35.2.3.Three or More Electrodes -- 35.3.Einzel Lenses -- 35.3.1.The Principal Potential Models -- 35.3.2.Measurements and Exact Calculations -- 35.3.3.Miniature Lenses -- 35.4.Grid or Foil Lenses -- 35.5.Conical Lenses and Coaxial Lenses -- 35.6.Cylindrical Lenses -- ch. 36 Magnetic Lenses -- 36.1.Introduction -- 36.1.1.Modes of Operation -- 36.1.2.Practical Design -- 36.1.3.Notation -- 36.2.Field Models -- 36.2.1.Symmetric Lenses: Glaser's Bell-Shaped Model -- 36.3.Related Bell-Shaped Curves -- 36.3.1.The Grivet -- Lenz Model -- 36.3.2.The Exponential Model -- 36.3.3.The Power Law Model -- 36.3.4.The Convolutional Models -- 36.3.5.A Generalized Model -- 36.3.6.Unsymmetric Lenses -- 36.3.7.Hahn's Procedure -- 36.3.8.Other Models -- 36.4.Measurements and Universal Curves -- 36.4.1.Introduction -- 36.4.2.Unsaturated Lenses -- 36.4.3.Saturated Lenses -- 36.5.Ultimate Lens Performance -- 36.5.1.Tretner's Analysis -- 36.5.2.Earlier Studies -- 36.5.3.Optimization -- 36.6.Lenses of Unusual Geometry -- 36.6.1.Mini-Lenses, Pancake Lenses and Single-Polepiece Lenses -- 36.6.2.Laminated Lenses -- 36.7.Special Purpose Lenses -- 36.7.1.Unsymmetrical Round Lenses -- 36.7.2.Superconducting Shielding Lenses or Cryolenses -- 36.7.3.Permanent-Magnet Lenses -- 36.7.4.Triple-Polepiece Projector Lenses -- 36.7.5.Objective Lens with Low Magnetic Field at the Specimen Capable of Good Resolution -- 36.7.6.Probe-Forming Lenses for Low-Voltage Scanning Electron Microscopes -- 36.7.7.Hybrid TEM -- STEM Operation: the Twin and Super-Twin Geometries -- 36.7.8.The Lotus-Root Multibeam Lens -- ch. 37 Electron Mirrors, Low-Energy-Electron Microscopes and Photoemission Electron Microscopes, Cathode Lenses and Field-Emission Microscopy -- 37.1.The Electron Mirror Microscope -- 37.2.Mirrors in Energy Analysis -- 37.3.Cathode Lenses, Low-Energy-Electron Microscopes and Photoemission Electron Microscopes -- 37.4.Field-Emission Microscopy -- 37.5.Ultrafast Electron Microscopy -- ch. 38 The Wien Filter -- ch. 39 Quadrupole Lenses -- 39.1.Introduction -- 39.2.The Rectangular and Bell-Shaped Models -- 39.3.Isolated Quadrupoles and Doublets -- 39.4.Triplets -- 39.5.Quadruplets -- 39.6.Other Quadrupole Geometries -- 39.6.1.Arc Lenses -- 39.6.2.Crossed Lenses -- 39.6.3.Biplanar Lenses -- 39.6.4.Astigmatic Tube Lenses -- 39.6.5.Transaxial Lenses -- 39.6.6.Radial Lenses -- ch. 40 Deflection Systems -- 40.1.Introduction -- 40.2.Field Models for Magnetic Deflection Systems -- 40.2.1.Field of a Closed Loop in Free Space -- 40.2.2.Approximate Treatment of Ferrite Shields -- 40.2.3.The Axial Harmonics -- 40.3.The Variable-Axis Lens -- 40.3.1.Theoretical Considerations -- 40.3.2.Practical Design -- 40.4.Alternative Concepts -- 40.5.Deflection Modes and Beam-Shaping Techniques -- pt. VIII Aberration Correction and Beam Intensity Distribution (Caustics) -- ch. 41 Aberration Correction -- 41.1.Introduction -- 41.2.Multipole Correctors -- 41.2.1.Quadrupoles and Octopoles -- 41.2.2.Sextupole Optics and Sextupole Correctors -- 41.2.3.Practical Designs -- 41.2.4.Measurement of Aberrations -- 41.3.Foil Lenses and Space Charge -- 41.3.1.Space Charge Clouds -- 41.3.2.Foil Lenses -- 41.4.Axial Conductors -- 41.5.Mirrors -- 41.6.High-Frequency Lenses -- 41.6.1.Spherical Correction -- 41.6.2.Chromatic Correction -- 41.7.Other Aspects of Aberration Correction -- 41.8.Concluding Remarks -- ch. 42 Caustics and Their Uses -- 42.1.Introduction -- 42.2.The Concept of the Caustic -- 42.3.The Caustic of a Round Lens -- 42.4.The Caustic of an Astigmatic Lens -- 42.5.Intensity Considerations -- 42.6.Higher Order Focusing Properties -- 42.7.Applications of Annular Systems -- pt. IX Electron Guns -- ch. 43 General Features of Electron Guns -- 43.1.Thermionic Electron Guns -- 43.2.Schottky Emission Guns -- 43.3.Cold Field Electron Emission Guns -- 43.4.Beam Transport Systems -- ch. 44 Theory of Electron Emission -- 44.1.General Relations -- 44.2.Transmission Through a Plane Barrier -- 44.3.Thermionic Electron Emission -- 44.4.The Tunnel Effect -- 44.5.Field Electron Emission -- 44.6.Schottky Emission -- 44.7.Concluding Remarks -- ch. 45 Pointed Cathodes Without Space Charge -- 45.1.The Spherical Cathode -- 45.2.The Diode Approximation -- 45.3.Field Calculation in Electron Sources with Pointed Cathodes -- 45.3.1.Analytic Field Models -- 45.3.2.Rigorous Methods -- 45.4.Simple Models -- 45.4.1.A Diode-Field Model -- 45.4.2.Thermionic Triode Guns -- ch. 46 Space Charge Effects -- 46.1.The Spherical Diode -- 46.2.Asymptotic Properties and Generalizations -- 46.3.Determination of the Space Charge -- 46.4.The Boersch Effect -- 46.4.1.Introduction -- 46.4.2.The Shift of the Mean Energy -- 46.4.3.Thermodynamic Considerations -- 46.4.4.Analytical Calculations -- ch. 47 Brightness -- 47.1.Application of Liouville's Theorem -- 47.2.The Maximum Brightness -- 47.3.The Influence of Apertures -- 47.4.Lenz's Brightness Theory -- 47.4.1.Rotationally Symmetric Electrostatic Fields -- 47.4.2.The Generalized Theory -- 47.5.Measurement of the Brightness -- 47.6.Coulomb Interactions and Brightness -- 47.7.Aberrations in the Theory of Brightness -- ch. 48 Emittance -- 48.1.Trace Space and Hyperemittance -- 48.2.Two-Dimensional Emittances -- 48.2.1.General Emittance Ellipses -- 48.2.2.Acceptance and Matching -- 48.3.Brightness and Emittance -- 48.4.Emittance Diagrams -- ch. 49 Gun Optics -- 49.1.The Fujita -- Shimoyama Theory -- 49.2.Rose's Theory -- 49.3.Matching the Paraxial Approximation to a Cathode Surface -- ch. 50 Complete Electron Guns -- 50.1.Justification of the Point Source Model -- 50.2.The Lens System in Field-Emission Devices -- 50.3.Hybrid Emission -- 50.4.Conventional Thermionic Guns -- 50.5.Pierce Guns -- 50.6.Multi-electron-beam Systems -- 50.7.Carbon Nanotube Emitters -- 50.8.Further Reading -- pt. X Systems with a Curved Optic Axis -- ch. 51 General Curvilinear Systems -- 51.1.Introduction of a Curvilinear Coordinate System -- 51.2.Series Expansion of the Potentials and Fields -- 51.3.Variational Principle and Trajectory Equations -- 51.4.Simplifying Symmetries -- 51.5.Trajectory Equations for Symmetric Configurations -- 51.6.Aberration Theory -- 51.6.1.Magnetic Systems -- 51.6.2.Compound Systems -- ch. 52 Sector Fields and Their Applications -- 52.1.Introduction -- 52.2.Magnetic Devices with a Circular Optic Axis -- 52.3.Radial (Horizontal) Focusing for a Particular Model Field -- 52.4.The Linear Dispersion -- 52.5.The Axial (Vertical) Focusing -- 52.6.Fringing Field Effects -- 52.7.Aberration Theory: The Homogeneous Magnetic Field (n = 0) -- 52.8.Optimization Procedures -- 52.8.1.Single Deflection Prisms -- 52.8.2.Use of Symmetries -- 52.9.Energy Analysers and Monochromators -- 52.9.1.Introduction -- 52.9.2.In-column Energy Analysers -- 52.9.3.Details of the Various Filters -- 52.9.4.The Mollenstedt and Ichinokawa Analysers -- 52.9.5.Postcolumn Spectrometers -- 52.9.6.Monochromators -- ch. 53 Unified Theories of Ion Optical Systems -- 53.1.Introduction -- 53.2.Electrostatic Prisms -- 53.3.A Unified Version of the Theory -- 53.4.The Literature of Ion Optics.
Includes bibliographical references and index.
Principles of electron optics. Volume two, Applied geometrical optics
London : Academic Press, an imprint of Elsevier, [2018]