rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advances in imaging and electron physics
    part number: Volume 204
  name:
    name part: Hawkes, P. W.
    role:
      role term: editor.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2017
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource : illustrations
  abstract: Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.- Contains contributions from leading authorities on the subject matter- Informs and updates on all the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons, and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing.
  table of contents: Front Cover -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- Future Contributions -- 1 New Physical Principle for Interference of Light and Material Particles -- 1 Introduction -- 2 A Novel Theoretical Model -- 3 General Law of Interference -- 4 Peculiarities of the New General Law of Interference -- 5 Extended Sources and Interference from Gratings -- 6 Diffraction Effects and Uncertainty Principle -- 7 Conclusion -- Acknowledgment -- References -- 2 A Review of Scanning Electron Microscopy in Near Field Emission Mode -- 1 Introduction -- 1.1 Motivation and Terminology -- 2 Instrumentation -- 2.1 First Prototype -- 2.2 Alignment and Operation -- 2.3 NFESEM Imaging -- 2.4 Related Field Electron Emission Scanning Microscopy Techniques -- 2.4.1 Electron Spin Polarization -- 2.4.2 Electron Energy Loss Spectroscopy -- 3 Geometric In uence on Field Emission -- 3.1 The FE Process -- 3.2 Vertical Resolution -- 4 Primary Electron Beam Generation -- 4.1 Emitter Preparation -- 4.1.1 F-N Plot Analysis of Experimental Data -- 4.1.2 Surface Contamination and FE Current Stability -- 4.2 Field Emission from Non-Planar Surfaces -- 4.3 Lensless Focusing -- 4.4 Source Characterization -- 5 Topographic Imaging -- 6 Alternative Contrast Mechanisms -- 6.1 Magnetic -- 6.2 Chemical -- 6.3 Future Prospects -- 7 Conclusions -- Appendix A Detector Calibration -- Appendix B Comparison of reff vs. rphys -- Acknowledgments -- Figure Acknowledgments -- Disclaimer -- References -- 3 Nonscalar Mathematical Morphology -- 1 Introduction -- 2 Lattice-Based Mathematical Morphology -- 2.1 Morphology for Binary Images -- 2.2 Complete Lattice Framework -- Mappings -- Invariance -- 2.3 (Hyper)connected Filters -- 2.4 Inf-Semilattices -- 3 Frames -- 3.1 De nitions -- 3.2 Lattices and Group Invariance.
  table of contents: 3.3 Constructing a Group Invariant Lattice -- 3.4 Going Back -- 3.5 Practical Considerations -- 3.6 Examples -- 3.6.1 Hue or Rotation Invariant -- 3.6.2 Hue and Saturation Invariant -- 4 Sponges -- 4.1 De nitions -- 4.2 Openings -- 4.3 Examples -- 4.3.1 The Inner Product Sponge -- 4.3.2 The (Hemi)spherical Sponges -- 4.3.3 Periodic Sponges -- 4.3.4 The Hyperbolic Sponge -- 5 n-Ary Morphology -- 5.1 De nitions -- 5.2 Adjunctions, Openings, and Closings -- 5.3 Example -- 6 Other Approaches -- 7 Summary and Conclusions -- References -- 4 Energy Analyzing and Energy Selecting Electron Microscopes -- 1 Introduction -- 2 Energy Analyzing and Selecting Devices -- 2.1 The Cylindrical Electrostatic Analyzer -- 2.2 The Cylindrical Magnetic Analyzer -- 2.3 Mirror Prism Device -- 3 Energy Analyzing Electron Microscopes -- 3.1 Instrumentation -- 3.2 Applications -- 4 Energy Selecting Electron Microscopes -- 4.1 Instrumentation -- 4.2 Applications -- Acknowledgments -- References -- Index -- Back Cover.
  note: edited by Peter W. Hawkes.
  note: Includes bibliographical references and index.
  subject:
    topic: Electrons
  subject:
    topic: Image processing
  subject:
    topic: Optoelectronic devices
  subject:
    topic: Optical data processing
  subject:
    topic: Electrons
  subject:
    topic: Électrons
  subject:
    topic: Traitement d'images
  subject:
    topic: Dispositifs optoélectroniques
  subject:
    topic: Traitement optique de l'information
  subject:
    topic: image processing
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electricity
  subject:
    topic: SCIENCE
    topic: Physics
    topic: Electromagnetism
  subject:
    topic: Electrons
  subject:
    topic: Image processing
  subject:
    topic: Optical data processing
  subject:
    topic: Optoelectronic devices
  classification: QC793.5.E62
  classification: 537.5
  related item:
    title info:
      title: Advances in Imaging and Electron Physics ; Volume 204
  related item:
    title info:
      title: Advances in imaging and electron physics. Volume 204
    origin info:
      publisher: London : Academic Press, [2017]
    identifier: (OCoLC)959875546
  identifier: 9780128121894
  identifier: 0128121890
  identifier: 9780128120866
  identifier: 9780128121894 Ingram Content Group
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OPELS
    record creation date: 171030
    record change date: 20260327152629.6
    record identifier: in00005762592
    language of cataloging:
      language term: eng