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Advances in imaging and electron physics
Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.- Contains contributions from leading authorities on the subject matter- Informs and updates on all the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons, and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing.
Front Cover -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- Future Contributions -- 1 New Physical Principle for Interference of Light and Material Particles -- 1 Introduction -- 2 A Novel Theoretical Model -- 3 General Law of Interference -- 4 Peculiarities of the New General Law of Interference -- 5 Extended Sources and Interference from Gratings -- 6 Diffraction Effects and Uncertainty Principle -- 7 Conclusion -- Acknowledgment -- References -- 2 A Review of Scanning Electron Microscopy in Near Field Emission Mode -- 1 Introduction -- 1.1 Motivation and Terminology -- 2 Instrumentation -- 2.1 First Prototype -- 2.2 Alignment and Operation -- 2.3 NFESEM Imaging -- 2.4 Related Field Electron Emission Scanning Microscopy Techniques -- 2.4.1 Electron Spin Polarization -- 2.4.2 Electron Energy Loss Spectroscopy -- 3 Geometric In uence on Field Emission -- 3.1 The FE Process -- 3.2 Vertical Resolution -- 4 Primary Electron Beam Generation -- 4.1 Emitter Preparation -- 4.1.1 F-N Plot Analysis of Experimental Data -- 4.1.2 Surface Contamination and FE Current Stability -- 4.2 Field Emission from Non-Planar Surfaces -- 4.3 Lensless Focusing -- 4.4 Source Characterization -- 5 Topographic Imaging -- 6 Alternative Contrast Mechanisms -- 6.1 Magnetic -- 6.2 Chemical -- 6.3 Future Prospects -- 7 Conclusions -- Appendix A Detector Calibration -- Appendix B Comparison of reff vs. rphys -- Acknowledgments -- Figure Acknowledgments -- Disclaimer -- References -- 3 Nonscalar Mathematical Morphology -- 1 Introduction -- 2 Lattice-Based Mathematical Morphology -- 2.1 Morphology for Binary Images -- 2.2 Complete Lattice Framework -- Mappings -- Invariance -- 2.3 (Hyper)connected Filters -- 2.4 Inf-Semilattices -- 3 Frames -- 3.1 De nitions -- 3.2 Lattices and Group Invariance.
3.3 Constructing a Group Invariant Lattice -- 3.4 Going Back -- 3.5 Practical Considerations -- 3.6 Examples -- 3.6.1 Hue or Rotation Invariant -- 3.6.2 Hue and Saturation Invariant -- 4 Sponges -- 4.1 De nitions -- 4.2 Openings -- 4.3 Examples -- 4.3.1 The Inner Product Sponge -- 4.3.2 The (Hemi)spherical Sponges -- 4.3.3 Periodic Sponges -- 4.3.4 The Hyperbolic Sponge -- 5 n-Ary Morphology -- 5.1 De nitions -- 5.2 Adjunctions, Openings, and Closings -- 5.3 Example -- 6 Other Approaches -- 7 Summary and Conclusions -- References -- 4 Energy Analyzing and Energy Selecting Electron Microscopes -- 1 Introduction -- 2 Energy Analyzing and Selecting Devices -- 2.1 The Cylindrical Electrostatic Analyzer -- 2.2 The Cylindrical Magnetic Analyzer -- 2.3 Mirror Prism Device -- 3 Energy Analyzing Electron Microscopes -- 3.1 Instrumentation -- 3.2 Applications -- 4 Energy Selecting Electron Microscopes -- 4.1 Instrumentation -- 4.2 Applications -- Acknowledgments -- References -- Index -- Back Cover.
Includes bibliographical references and index.
Advances in Imaging and Electron Physics ; Volume 204
Advances in imaging and electron physics. Volume 204