rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: ESD protection methodologies
    sub title: from component to system
  name:
    name part: Bafleur, Marise
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Caignet, Fabrice
    role:
      role term: author.
  name:
    name part: Nolhier, Nicolas
    role:
      role term: author.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2017
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource : illustrations
  abstract: Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.
  table of contents: Front Cover; ESD Protection Methodologies: From Component to System ; Copyright ; Contents; Foreword 1; Foreword 2; Preface; Introduction; I.1. Origin of electrostatic discharge; I.2. Impact on the electronics; I.3. ESD Protected Area or "EPA"; I.4. Conclusion; 1. ESD Standards: From Component to System; 1.1. Standards: From component to system; 1.2. Component level standards: HBM, MM, CDM, HMM; 1.3. Standards at the system level; 1.4. Conclusion; 2. Characterization Techniques; 2.1. Component level electrical characterization techniques; 2.2. System measurement methods.
  table of contents: 2.3. Injection methods2.4. Failure analysis techniques; 2.5. Conclusion; 3. Protection Strategies Against ESD; 3.1. ESD design window; 3.2. Elementary protective components; 3.3. Discrete protections; 3.4. Challenges of the protection strategy at the system level; 3.5. Conclusion; 4. Modeling and Simulation Methods; 4.1. Physical simulation: TCAD approach to the optimization of elementary protections; 4.2. Electrical simulation: Compact modeling; 4.3. Behavioral simulation for prediction at the system level; 4.4. Conclusion; 5. Case Studies.
  table of contents: 5.1. Case 1: Interaction between two types of protection5.2. Case 2: Detection of latent defaults caused by CDM stress; 5.3. Case 3: The impact of decoupling capacitors in propagation paths in a circuit; 5.4. Case 4: Functional failure linked to a decoupling capacitor; 5.5. Case 5: Fatal failure in an LIN circuit; 5.6. Case 6: Functional failure in a 16-bit microcontroller; 5.7. Conclusion; Conclusion; General rules for a global ESD protection strategy; Conclusion; Bibliography; Index; Back Cover.
  note: Marise Bafleur, Fabrice Caignet and Nicolas Nolhier.
  note: Includes bibliographical references and index.
  subject:
    topic: Electric discharges
  subject:
    topic: Electrostatics
  subject:
    topic: Electronic apparatus and appliances
    topic: Protection
  subject:
    topic: Electric action of points
  subject:
    topic: Décharges électriques
  subject:
    topic: Appareils électroniques
    topic: Protection
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Mechanical
  subject:
    topic: Electric action of points
  subject:
    topic: Electric discharges
  subject:
    topic: Electronic apparatus and appliances
    topic: Protection
  subject:
    topic: Electrostatics
  classification: QC585.7.E43
  classification: 621.3815
  related item:
    identifier: (OCoLC)954224152
  related item:
    title info:
      title: Energy management in embedded systems set
  identifier: 9780081011607
  identifier: 0081011601
  identifier: 9781785481222
  identifier: 1785481223
  identifier: 2017300207
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 170731
    record change date: 20260327152236.2
    record identifier: in00005762278
    language of cataloging:
      language term: eng