http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.
Front Cover; ESD Protection Methodologies: From Component to System ; Copyright ; Contents; Foreword 1; Foreword 2; Preface; Introduction; I.1. Origin of electrostatic discharge; I.2. Impact on the electronics; I.3. ESD Protected Area or "EPA"; I.4. Conclusion; 1. ESD Standards: From Component to System; 1.1. Standards: From component to system; 1.2. Component level standards: HBM, MM, CDM, HMM; 1.3. Standards at the system level; 1.4. Conclusion; 2. Characterization Techniques; 2.1. Component level electrical characterization techniques; 2.2. System measurement methods.
2.3. Injection methods2.4. Failure analysis techniques; 2.5. Conclusion; 3. Protection Strategies Against ESD; 3.1. ESD design window; 3.2. Elementary protective components; 3.3. Discrete protections; 3.4. Challenges of the protection strategy at the system level; 3.5. Conclusion; 4. Modeling and Simulation Methods; 4.1. Physical simulation: TCAD approach to the optimization of elementary protections; 4.2. Electrical simulation: Compact modeling; 4.3. Behavioral simulation for prediction at the system level; 4.4. Conclusion; 5. Case Studies.
5.1. Case 1: Interaction between two types of protection5.2. Case 2: Detection of latent defaults caused by CDM stress; 5.3. Case 3: The impact of decoupling capacitors in propagation paths in a circuit; 5.4. Case 4: Functional failure linked to a decoupling capacitor; 5.5. Case 5: Fatal failure in an LIN circuit; 5.6. Case 6: Functional failure in a 16-bit microcontroller; 5.7. Conclusion; Conclusion; General rules for a global ESD protection strategy; Conclusion; Bibliography; Index; Back Cover.
Marise Bafleur, Fabrice Caignet and Nicolas Nolhier.
Includes bibliographical references and index.
Energy management in embedded systems set