rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Materials science and engineering of carbon
    sub title: characterization
  name:
    name part: Inagaki, Michio
    role:
      role term: editor.
  name:
    name part: Kang, Feiyu
    role:
      role term: editor.
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2016
    copyright date: 2016
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource
  abstract: Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups. Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications.
  table of contents: Front Cover; Materials Science and Engineering of Carbon: Characterization; Materials Science and Engineering of Carbon: Characterization ; Copyright; Contents; Companion Web Site; List of Contributors; Preface; Acknowledgments; 1 -- Introduction; 1.1 CARBON MATERIALS; 1.2 CHARACTERIZATION OF CARBON MATERIALS; 1.3 STRUCTURE OF THE PRESENT BOOK; REFERENCES; 2 -- X-ray Powder Diffraction; 2.1 INTRODUCTION; 2.2 X-RAY DIFFRACTION PATTERN OF CARBON MATERIALS; 2.3 PARAMETERS DETERMINED BY X-RAY DIFFRACTION; 2.4 INSTRUMENTATION; 2.5 SPECIFICATIONS FOR MEASUREMENT
  table of contents: 2.5.1 PREPARATION OF SAMPLE FOR X-RAY MEASUREMENTS2.5.2 MEASUREMENT AND INTENSITY CORRECTION OF DIFFRACTION PROFILES; 2.5.3 CORRECTION OF DIFFRACTION ANGLE WITH INTERNAL STANDARD; 2.5.4 DETERMINATION OF FULL WIDTH AT HALF MAXIMUM INTENSITY; 2.5.5 ACCURACY OF THE VALUES DETERMINED; 2.6 DEGREE OF GRAPHITIZATION; 2.7 KEY ISSUES FOR MEASUREMENT; 2.7.1 DIFFRACTION PATTERN; 2.7.2 USE OF INTERNAL STANDARD; 2.7.3 USE OF THIN SAMPLE HOLDER; 2.7.4 INDEXING THE DIFFRACTION LINE; 2.7.5 SEPARATION INTO COMPONENT PROFILES; 2.8 CONCLUDING REMARKS; REFERENCES; 3 -- Small-Angle X-ray Scattering
  table of contents: 3.1 INTRODUCTION3.2 FUNDAMENTALS; 3.3 KEY ISSUES FOR THE MEASUREMENTS; 3.4 APPLICATIONS FOR CARBON MATERIALS; 3.4.1 POROUS CARBON FIBERS; 3.4.2 GLASS-LIKE CARBONS; 3.4.3 MESOCELLULAR FOAM CARBONS (SILICA-TEMPLATED CARBONS); 3.4.4 OPEN PORES FORMED BY AIR OXIDATION; 3.5 CONCLUDING REMARKS; REFERENCES; 4 -- Transmission Electron Microscopy; 4.1 INTRODUCTION; 4.2 MODES OF TRANSMISSION ELECTRON MICROSCOPY [3-5]; 4.2.1 DIFFRACTING MODE; 4.2.2 IMAGING MODES; 4.3 KEY ISSUES FOR OBSERVATION; 4.3.1 OBJECT THICKNESS (WEAK PHASE OBJECT) [6]
  table of contents: 4.3.2 CONTRAST TRANSFER FUNCTION OF THE TRANSMISSION ELECTRON MICROSCOPE [6]4.3.2.1 Objective Lens Defects; 4.3.2.1.1 Spherical Aberration Cs; 4.3.2.1.1 Spherical Aberration Cs; 4.3.2.1.2 Objective Lens Aperture; 4.3.2.1.2 Objective Lens Aperture; 4.3.2.1.3 Ellipticity Astigmatism; 4.3.2.1.3 Ellipticity Astigmatism; 4.3.2.2 Illumination Defects; 4.3.2.2.1 Information Limit (Termination) [12]; 4.3.2.2.1 Information Limit (Termination) [12]; 4.3.2.2.2 Spatial Coherency; 4.3.2.2.2 Spatial Coherency; 4.3.3 DIFFUSION CONTRASTS; 4.3.4 FRESNEL FRINGES, IE, EDGE FRINGES [4]
  table of contents: 4.5 APPLICATIONS FOR CARBON MATERIALS [1,2,5,17-19]4.5.1 TRANSMISSION ELECTRON MICROSCOPY MODES TO STUDY CRYSTALLINITY OF CARBON MATERIALS; 4.5.2 TRANSMISSION ELECTRON MICROSCOPY MODES IN THE STUDY OF CARBONIZATION AND GRAPHITIZATION; 4.6 CONCLUSIONS; REFERENCES; FURTHER READING; 5 -- Scanning Electron Microscopy; 5.1 INTRODUCTION; 5.2 INSTRUMENTATION AND RESOLVING POWER; 5.2.1 INSTRUMENTATION; 5.2.2 MAGNIFICATION AND RESOLVING POWER OF THE SCANNING ELECTRON MICROSCOPE; 5.2.3 EDGE EFFECTS APPEARING IN SE MODE IMAGES; 5.3 SPECIMEN PREPARATION
  note: edited by Michio Inagaki, Feiyu Kang.
  note: Includes bibliographical references at the end of each chapters and index.
  subject:
    topic: Nanostructured materials
  subject:
    topic: Carbon
  subject:
    topic: Nanostructures
  subject:
    topic: Carbon
  subject:
    topic: Nanomatériaux
  subject:
    topic: Carbone
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Engineering (General)
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Reference
  subject:
    topic: Carbon
  subject:
    topic: Nanostructured materials
  classification: TA418.9.N35
  classification: 620.1/15
  related item:
    title info:
      title: Materials science and engineering of carbon
    origin info:
      publisher: Amsterdam : Elsevier : Butterworth-Heinemann 2016
    identifier: (DLC) 2015957907
    identifier: (OCoLC)930255279
  identifier: 9780128054680
  identifier: 0128054689
  identifier: 9780128052563
  identifier: 0128052562
  identifier: 5C87786C-E261-4E1D-8E5C-B7AB610B836E OverDrive, Inc.
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OPELS
    record creation date: 160705
    record change date: 20260407210637.8
    record identifier: in00005760656
    language of cataloging:
      language term: eng